* Steven J. Hill <sjhill@realitydiluted.com>
* Thomas Gleixner <tglx@linutronix.de>
*
- * $Id: nand.h,v 1.63 2004/07/07 16:29:43 gleixner Exp $
+ * $Id: nand.h,v 1.25 2003/05/21 15:15:02 dwmw2 Exp $
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License version 2 as
* NAND_YAFFS_OOB
* 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
* Split manufacturer and device ID structures
- *
- * 02-08-2004 tglx added option field to nand structure for chip anomalities
- * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
- * update of nand_chip structure description
*/
#ifndef __LINUX_MTD_NAND_H
#define __LINUX_MTD_NAND_H
#include <linux/config.h>
#include <linux/wait.h>
#include <linux/spinlock.h>
-#include <linux/mtd/mtd.h>
struct mtd_info;
-/* Scan and identify a NAND device */
-extern int nand_scan (struct mtd_info *mtd, int max_chips);
-/* Free resources held by the NAND device */
-extern void nand_release (struct mtd_info *mtd);
-
-/* Read raw data from the device without ECC */
-extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
-
-
-/* The maximum number of NAND chips in an array */
-#define NAND_MAX_CHIPS 8
-
-/* This constant declares the max. oobsize / page, which
- * is supported now. If you add a chip with bigger oobsize/page
- * adjust this accordingly.
+/*
+ * Searches for a NAND device
*/
-#define NAND_MAX_OOBSIZE 64
+extern int nand_scan (struct mtd_info *mtd);
/*
* Constants for hardware specific CLE/ALE/NCE function
*/
-/* Select the chip by setting nCE to low */
#define NAND_CTL_SETNCE 1
-/* Deselect the chip by setting nCE to high */
#define NAND_CTL_CLRNCE 2
-/* Select the command latch by setting CLE to high */
#define NAND_CTL_SETCLE 3
-/* Deselect the command latch by setting CLE to low */
#define NAND_CTL_CLRCLE 4
-/* Select the address latch by setting ALE to high */
#define NAND_CTL_SETALE 5
-/* Deselect the address latch by setting ALE to low */
#define NAND_CTL_CLRALE 6
-/* Set write protection by setting WP to high. Not used! */
-#define NAND_CTL_SETWP 7
-/* Clear write protection by setting WP to low. Not used! */
-#define NAND_CTL_CLRWP 8
/*
* Standard NAND flash commands
#define NAND_CMD_READOOB 0x50
#define NAND_CMD_ERASE1 0x60
#define NAND_CMD_STATUS 0x70
-#define NAND_CMD_STATUS_MULTI 0x71
#define NAND_CMD_SEQIN 0x80
#define NAND_CMD_READID 0x90
#define NAND_CMD_ERASE2 0xd0
#define NAND_CMD_RESET 0xff
-/* Extended commands for large page devices */
-#define NAND_CMD_READSTART 0x30
-#define NAND_CMD_CACHEDPROG 0x15
-
-/* Status bits */
-#define NAND_STATUS_FAIL 0x01
-#define NAND_STATUS_FAIL_N1 0x02
-#define NAND_STATUS_TRUE_READY 0x20
-#define NAND_STATUS_READY 0x40
-#define NAND_STATUS_WP 0x80
-
/*
* Constants for ECC_MODES
- */
-
-/* No ECC. Usage is not recommended ! */
+ *
+ * NONE: No ECC
+ * SOFT: Software ECC 3 byte ECC per 256 Byte data
+ * HW3_256: Hardware ECC 3 byte ECC per 256 Byte data
+ * HW3_512: Hardware ECC 3 byte ECC per 512 Byte data
+ *
+ *
+*/
#define NAND_ECC_NONE 0
-/* Software ECC 3 byte ECC per 256 Byte data */
#define NAND_ECC_SOFT 1
-/* Hardware ECC 3 byte ECC per 256 Byte data */
#define NAND_ECC_HW3_256 2
-/* Hardware ECC 3 byte ECC per 512 Byte data */
#define NAND_ECC_HW3_512 3
-/* Hardware ECC 3 byte ECC per 512 Byte data */
#define NAND_ECC_HW6_512 4
-/* Hardware ECC 8 byte ECC per 512 Byte data */
-#define NAND_ECC_HW8_512 6
+#define NAND_ECC_DISKONCHIP 5
/*
* Constants for Hardware ECC
*/
-/* Reset Hardware ECC for read */
#define NAND_ECC_READ 0
-/* Reset Hardware ECC for write */
#define NAND_ECC_WRITE 1
-/* Enable Hardware ECC before syndrom is read back from flash */
-#define NAND_ECC_READSYN 2
-
-/* Option constants for bizarre disfunctionality and real
-* features
-*/
-/* Chip can not auto increment pages */
-#define NAND_NO_AUTOINCR 0x00000001
-/* Buswitdh is 16 bit */
-#define NAND_BUSWIDTH_16 0x00000002
-/* Device supports partial programming without padding */
-#define NAND_NO_PADDING 0x00000004
-/* Chip has cache program function */
-#define NAND_CACHEPRG 0x00000008
-/* Chip has copy back function */
-#define NAND_COPYBACK 0x00000010
-/* AND Chip which has 4 banks and a confusing page / block
- * assignment. See Renesas datasheet for further information */
-#define NAND_IS_AND 0x00000020
-/* Chip has a array of 4 pages which can be read without
- * additional ready /busy waits */
-#define NAND_4PAGE_ARRAY 0x00000040
-
-/* Options valid for Samsung large page devices */
-#define NAND_SAMSUNG_LP_OPTIONS \
- (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
-
-/* Macros to identify the above */
-#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
-#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
-#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
-#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
-
-/* Mask to zero out the chip options, which come from the id table */
-#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
-
-/* Non chip related options */
-/* Use a flash based bad block table. This option is passed to the
- * default bad block table function. */
-#define NAND_USE_FLASH_BBT 0x00010000
-/* The hw ecc generator provides a syndrome instead a ecc value on read
- * This can only work if we have the ecc bytes directly behind the
- * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
-#define NAND_HWECC_SYNDROME 0x00020000
-
-
-/* Options set by nand scan */
-/* Nand scan has allocated oob_buf */
-#define NAND_OOBBUF_ALLOC 0x40000000
-/* Nand scan has allocated data_buf */
-#define NAND_DATABUF_ALLOC 0x80000000
-
-
+
/*
- * nand_state_t - chip states
* Enumeration for NAND flash chip state
*/
typedef enum {
FL_READING,
FL_WRITING,
FL_ERASING,
- FL_SYNCING,
- FL_CACHEDPRG,
+ FL_SYNCING
} nand_state_t;
-/**
- * struct nand_chip - NAND Private Flash Chip Data
- * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
- * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
- * @read_byte: [REPLACEABLE] read one byte from the chip
- * @write_byte: [REPLACEABLE] write one byte to the chip
- * @read_word: [REPLACEABLE] read one word from the chip
- * @write_word: [REPLACEABLE] write one word to the chip
- * @write_buf: [REPLACEABLE] write data from the buffer to the chip
- * @read_buf: [REPLACEABLE] read data from the chip into the buffer
- * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
- * @select_chip: [REPLACEABLE] select chip nr
- * @block_bad: [REPLACEABLE] check, if the block is bad
- * @block_markbad: [REPLACEABLE] mark the block bad
- * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
- * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
- * If set to NULL no access to ready/busy is available and the ready/busy information
- * is read from the chip status register
- * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
- * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
- * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
- * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
- * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
- * be provided if a hardware ECC is available
- * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
- * @scan_bbt: [REPLACEABLE] function to scan bad block table
- * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
- * @eccsize: [INTERN] databytes used per ecc-calculation
- * @eccsteps: [INTERN] number of ecc calculation steps per page
- * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
- * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip
- * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
- * @state: [INTERN] the current state of the NAND device
- * @page_shift: [INTERN] number of address bits in a page (column address bits)
- * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
- * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
- * @chip_shift: [INTERN] number of address bits in one chip
- * @data_buf: [INTERN] internal buffer for one page + oob
- * @oob_buf: [INTERN] oob buffer for one eraseblock
- * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
- * @data_poi: [INTERN] pointer to a data buffer
- * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
- * special functionality. See the defines for further explanation
- * @badblockpos: [INTERN] position of the bad block marker in the oob area
- * @numchips: [INTERN] number of physical chips
- * @chipsize: [INTERN] the size of one chip for multichip arrays
- * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
- * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
- * @autooob: [REPLACEABLE] the default (auto)placement scheme
- * @bbt: [INTERN] bad block table pointer
- * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
- * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
- * @priv: [OPTIONAL] pointer to private chip date
+/*
+ * NAND Private Flash Chip Data
+ *
+ * Structure overview:
+ *
+ * IO_ADDR_R - address to read the 8 I/O lines of the flash device
+ *
+ * IO_ADDR_W - address to write the 8 I/O lines of the flash device
+ *
+ * hwcontrol - hardwarespecific function for accesing control-lines
+ *
+ * dev_ready - hardwarespecific function for accesing device ready/busy line
+ *
+ * waitfunc - hardwarespecific function for wait on ready
+ *
+ * calculate_ecc - function for ecc calculation or readback from ecc hardware
+ *
+ * correct_data - function for ecc correction, matching to ecc generator (sw/hw)
+ *
+ * enable_hwecc - function to enable (reset) hardware ecc generator
+ *
+ * eccmod - mode of ecc: see constants
+ *
+ * eccsize - databytes used per ecc-calculation
+ *
+ * chip_delay - chip dependent delay for transfering data from array to read regs (tR)
+ *
+ * chip_lock - spinlock used to protect access to this structure
+ *
+ * wq - wait queue to sleep on if a NAND operation is in progress
+ *
+ * state - give the current state of the NAND device
+ *
+ * page_shift - number of address bits in a page (column address bits)
+ *
+ * data_buf - data buffer passed to/from MTD user modules
+ *
+ * data_cache - data cache for redundant page access and shadow for
+ * ECC failure
+ *
+ * cache_page - number of last valid page in page_cache
*/
-
struct nand_chip {
unsigned long IO_ADDR_R;
unsigned long IO_ADDR_W;
-
- u_char (*read_byte)(struct mtd_info *mtd);
- void (*write_byte)(struct mtd_info *mtd, u_char byte);
- u16 (*read_word)(struct mtd_info *mtd);
- void (*write_word)(struct mtd_info *mtd, u16 word);
-
- void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
- void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
- int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
- void (*select_chip)(struct mtd_info *mtd, int chip);
- int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
- int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
- void (*hwcontrol)(struct mtd_info *mtd, int cmd);
- int (*dev_ready)(struct mtd_info *mtd);
+ void (*hwcontrol)(int cmd);
+ int (*dev_ready)(void);
void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
- int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
- int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
- void (*enable_hwecc)(struct mtd_info *mtd, int mode);
- void (*erase_cmd)(struct mtd_info *mtd, int page);
- int (*scan_bbt)(struct mtd_info *mtd);
+ void (*calculate_ecc)(const u_char *dat, u_char *ecc_code);
+ int (*correct_data)(u_char *dat, u_char *read_ecc, u_char *calc_ecc);
+ void (*enable_hwecc)(int mode);
int eccmode;
int eccsize;
- int eccsteps;
int chip_delay;
- spinlock_t chip_lock;
+ spinlock_t chip_lock;
wait_queue_head_t wq;
nand_state_t state;
int page_shift;
- int phys_erase_shift;
- int bbt_erase_shift;
- int chip_shift;
u_char *data_buf;
- u_char *oob_buf;
- int oobdirty;
u_char *data_poi;
- unsigned int options;
- int badblockpos;
- int numchips;
- unsigned long chipsize;
- int pagemask;
- int pagebuf;
- struct nand_oobinfo *autooob;
- uint8_t *bbt;
- struct nand_bbt_descr *bbt_td;
- struct nand_bbt_descr *bbt_md;
- void *priv;
};
/*
#define NAND_MFR_SAMSUNG 0xec
#define NAND_MFR_FUJITSU 0x04
#define NAND_MFR_NATIONAL 0x8f
-#define NAND_MFR_RENESAS 0x07
-#define NAND_MFR_STMICRO 0x20
-/**
- * struct nand_flash_dev - NAND Flash Device ID Structure
- *
- * @name: Identify the device type
- * @id: device ID code
- * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
- * If the pagesize is 0, then the real pagesize
- * and the eraseize are determined from the
- * extended id bytes in the chip
- * @erasesize: Size of an erase block in the flash device.
- * @chipsize: Total chipsize in Mega Bytes
- * @options: Bitfield to store chip relevant options
+/*
+ * NAND Flash Device ID Structure
+ *
+ * Structure overview:
+ *
+ * name - Identify the device type
+ *
+ * id - device ID code
+ *
+ * chipshift - total number of address bits for the device which
+ * is used to calculate address offsets and the total
+ * number of bytes the device is capable of.
+ *
+ * page256 - denotes if flash device has 256 byte pages or not.
+ *
+ * pageadrlen - number of bytes minus one needed to hold the
+ * complete address into the flash array. Keep in
+ * mind that when a read or write is done to a
+ * specific address, the address is input serially
+ * 8 bits at a time. This structure member is used
+ * by the read/write routines as a loop index for
+ * shifting the address out 8 bits at a time.
+ *
+ * erasesize - size of an erase block in the flash device.
*/
struct nand_flash_dev {
- char *name;
+ char * name;
int id;
- unsigned long pagesize;
- unsigned long chipsize;
+ int chipshift;
unsigned long erasesize;
- unsigned long options;
+ char page256;
};
-/**
- * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
- * @name: Manufacturer name
- * @id: manufacturer ID code of device.
+/*
+ * NAND Flash Manufacturer ID Structure
+ *
+ * name - Manufacturer name
+ *
+ * id - manufacturer ID code of device.
*/
struct nand_manufacturers {
int id;
extern struct nand_flash_dev nand_flash_ids[];
extern struct nand_manufacturers nand_manuf_ids[];
-/**
- * struct nand_bbt_descr - bad block table descriptor
- * @options: options for this descriptor
- * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
- * when bbt is searched, then we store the found bbts pages here.
- * Its an array and supports up to 8 chips now
- * @offs: offset of the pattern in the oob area of the page
- * @veroffs: offset of the bbt version counter in the oob are of the page
- * @version: version read from the bbt page during scan
- * @len: length of the pattern, if 0 no pattern check is performed
- * @maxblocks: maximum number of blocks to search for a bbt. This number of
- * blocks is reserved at the end of the device where the tables are
- * written.
- * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
- * bad) block in the stored bbt
- * @pattern: pattern to identify bad block table or factory marked good /
- * bad blocks, can be NULL, if len = 0
- *
- * Descriptor for the bad block table marker and the descriptor for the
- * pattern which identifies good and bad blocks. The assumption is made
- * that the pattern and the version count are always located in the oob area
- * of the first block.
- */
-struct nand_bbt_descr {
- int options;
- int pages[NAND_MAX_CHIPS];
- int offs;
- int veroffs;
- uint8_t version[NAND_MAX_CHIPS];
- int len;
- int maxblocks;
- int reserved_block_code;
- uint8_t *pattern;
-};
-
-/* Options for the bad block table descriptors */
-
-/* The number of bits used per block in the bbt on the device */
-#define NAND_BBT_NRBITS_MSK 0x0000000F
-#define NAND_BBT_1BIT 0x00000001
-#define NAND_BBT_2BIT 0x00000002
-#define NAND_BBT_4BIT 0x00000004
-#define NAND_BBT_8BIT 0x00000008
-/* The bad block table is in the last good block of the device */
-#define NAND_BBT_LASTBLOCK 0x00000010
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_ABSPAGE 0x00000020
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_SEARCH 0x00000040
-/* bbt is stored per chip on multichip devices */
-#define NAND_BBT_PERCHIP 0x00000080
-/* bbt has a version counter at offset veroffs */
-#define NAND_BBT_VERSION 0x00000100
-/* Create a bbt if none axists */
-#define NAND_BBT_CREATE 0x00000200
-/* Search good / bad pattern through all pages of a block */
-#define NAND_BBT_SCANALLPAGES 0x00000400
-/* Scan block empty during good / bad block scan */
-#define NAND_BBT_SCANEMPTY 0x00000800
-/* Write bbt if neccecary */
-#define NAND_BBT_WRITE 0x00001000
-/* Read and write back block contents when writing bbt */
-#define NAND_BBT_SAVECONTENT 0x00002000
-/* Search good / bad pattern on the first and the second page */
-#define NAND_BBT_SCAN2NDPAGE 0x00004000
-
-/* The maximum number of blocks to scan for a bbt */
-#define NAND_BBT_SCAN_MAXBLOCKS 4
-
-extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
-extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
-extern int nand_default_bbt (struct mtd_info *mtd);
-extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
-extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
-
/*
* Constants for oob configuration
*/
-#define NAND_SMALL_BADBLOCK_POS 5
-#define NAND_LARGE_BADBLOCK_POS 0
+#define NAND_BADBLOCK_POS 5
#endif /* __LINUX_MTD_NAND_H */
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